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Nano-Wetting of Rough Super-Hydrophobic Surfaces

2009년 2월 26일 16시 27분 59초
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고분자화학 - Recent Researches on Nano-Scale Structures of Polymeric Materials Using Synchrotron Radiation Sources I
저자 및
Hua Zhang, Robert Lamb
School of Chemistry,University of Melbourne, Parkville, VIC 3010, Australia, Korea
Superhydrophobicity generally refers to surfaces with water contact angle (θ) >150°. Fabrication of superhydrophobic coatings has become a rapidly expanding area of research over the last few years, due primarily to their self-cleaning ability. The two key attributes to be considered in the "chemical design" of such interfaces are the chemical composition and physical tructure. In this work we describe coatings in which the nanostructural roughness is manipulated to create superhydrophobicity from (chemically) low (θ <90°) contact angle materials. These have fabricated surfaces based on relatively common chemical components without the use of fluorinated groups which are usually common in such coatings.

Thin films were prepared from the combination of polymers bound to nanometer size particles to produce a novel 3-dimensional organic/inorganic hybrid network 1,2. Resultant water contact angles routinely > 150° were typical with contact angle hysteresis <10°. Typical roughness ratios in the range of 1.45 - 2.75 were measured using Atomic Force Microscopy (AFM).

The relationship between this micro/nanostructure and wettability is not really explained by such measurements.

Small angle x-ray scattering (SAXS) has been used 3 to investigate the in-situ immersive wetting of these ultra rough surfaces. Reduced scattering contrast observed from rough surfaces when partially or totally wetted demonstrates significant physical differences between super-hydrophobic surfaces not otherwise apparent from conventional contact angle measurements. This has a direct relationship with bio-adhesion which is critically dependent on the nature of the nanoscale roughness built into the surfaces and in particular the air incursion on nanometer length scales.

1. Zhang, H.,Jones, A. W., Lamb, R.N., US Patent No. 6,743,467
2. Lamb, R.N., Zhang, H, Raston, C.L., European Patent No. 0969934
3. Zhang, H, Cookson, D. , Lamb, R.N., Appl Physics Letts 91, 254106-254109, (2007)