초록문의 abstract@kcsnet.or.kr

결제문의 member@kcsnet.or.kr

현재 가능한 작업은 아래와 같습니다.
  • 09월 04일 17시 이후 : 초록수정 불가능, 일정확인 및 검색만 가능

제114회 대한화학회 학술발표회, 총회 및 기기전시회 안내 Raman Metrology for Surface Scientific Investigation of 2-Dimensional Systems

2014년 9월 4일 15시 23분 53초
PHYS2-2 이곳을 클릭하시면 발표코드에 대한 설명을 보실 수 있습니다.
목 14시 : 00분
물리화학 - Recent Trends in Physical Chemistry
저자 및
포항공과대학교(POSTECH) 화학과, Korea
Atom-thick crystals have served as unique systems to explore new physics and chemistry in two dimension. Raman spectroscopy has proven to be a versatile analytical tool for two-dimensional systems because of the varying spectral features for different thickness, stacking, defect density, charge density (n), mechanical strain (ε), temperature, etc. Such multimodal sensitivity, however, turns into difficulty when multiple unknown variables are to be determined simultaneously. Despite the strain-sensitivity of the Raman G and 2D modes, for example, optical characterization of native strain in graphene on silica substrates has been hampered by excess charges interfering with both modes. In this talk, I will show that the effects of strain and charges in graphene can be optically separated from each other by correlation analysis of the two modes, enabling simple quantification of both.[1] Employing the proposed analysis, I will address our recent findings on important surface scientific issues of graphene such as structural deformation caused by substrates and thermal perturbation,[1] interfacial charge transfer,[2] and molecular intercalation[3] through graphene-substrate interface. References [1] J. E. Lee, G. Ahn, J. Shim, Y. S. Lee, and S. Ryu,* “Optical Separation of Mechanical Strain from Charge Doping in Graphene”, Nature Commun. 3, 1024 (2012) [2] S. Ryu, Li Liu, S. Berciaud, Y.-J. Yu, H. Liu, P. Kim, G. W. Flynn, and L. E. Brus, “Atmospheric Oxygen Binding and Hole Doping in Deformed Graphene on a SiO2 Substrate”, Nano Lett. 10, 4944 (2010) [3] D. Lee, G. Ahn and S. Ryu,* “Two-Dimensional Water Diffusion at a Graphene-Silica Janus Interface”, J. Am. Chem. Soc. 136, 6634 (2014)