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학술발표회초록보기

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  • 09월 03일 23시 이후 : 초록수정 불가능, 일정확인 및 검색만 가능

제122회 대한화학회 학술발표회, 총회 및 기기전시회 안내 Analytical Approaches to a Failure Analysis from chemicals to devices in Displays

등록일
2018년 9월 3일 17시 30분 35초
접수번호
2203
발표코드
ANAL1-6 이곳을 클릭하시면 발표코드에 대한 설명을 보실 수 있습니다.
발표시간
목 17시 : 30분
발표형식
분과기념
발표분야
Analytical Chemistry - Generation Networking Symposium in Analytical Chemistry
저자 및
공동저자
Hyuk Nyun Kim
Department of Analytical Technology, LG Display, Korea
The Display industries in Korea have been played important roles in the production of various displays such as LCDs and OLEDs, as a core technology based business of Korea since 2000. More advanced developments and production of better performed products of various displays from mobile to large TV applications, have always been required appropriate analytical tools or methods which can help us to monitor higher quality manufacturing and to identify the root cause of problems.
To improve the quality of state of the art display products, we need to find out and verify the failure mechanism of defects such as dark spots, bright spots, an abnormal display such as mura and image sticking as well as the mechanism of degradation of life time of OLEDs. We discuss the general analytical approaches to elucidate the root causes of display defects and decay of life time of displays using from chemical analytical instruments, GC-MS, LC-MS, SFC-MS to surface sensitive analytical instruments, XPS/ToF-SIMS/D-SIMS and structural analytical instruments, TEM/FIB/SEM with various sample pre-treatment tools for chemicals, components and devices.

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