abs
본문내용바로가기
KCS
학술발표회
화학이야기
발행지
학회소식
학회소개
KR
EN
학술발표회
상세안내
초록보기
초록통계
초록집 모음
초록등록
기기전시회 안내
화학이야기
주기율표
화학술어
화합물 명명법
네이버 화학백과
연구실험실 안전정보
연구윤리 정보
화학올림피아드
화학포스터 시화대회
발행지
저널
화학세계
화학교육
학회소식
학회소식/공지사항
학술행사/정보마당
언론에 비친 KCS
구인/구직
회원동정
후원사 혜택 안내
지면 광고 안내
학회소개
정관/세칙
소개 및 활동/사업
현임원
역대임원
연혁
역대 학회상 수상자
대한화학회 창립 75주년
분과회/지부
학회자료실
이사회 회의록
단체회원
전자앨범
사무국/오시는 길
로그인
회원가입
회원안내
로그인
회원가입
회원안내
English
메뉴열기/닫기
학술발표회
초록보기
홈
학술발표회
학술발표회
화학이야기
발행지
학회소식
학회소개
초록보기
상세안내
초록보기
초록통계
초록집 모음
초록등록
기기전시회 안내
초록문의
abstract@kcsnet.or.kr
결제문의
member@kcsnet.or.kr
현재 가능한 작업은 아래와 같습니다.
09월 03일 23시 이후 : 초록수정 불가능, 일정확인 및 검색만 가능
제122회 대한화학회 학술발표회, 총회 및 기기전시회 안내
Development of integrated Correlative Light and Electron Microscope
등록일
2018년 8월 23일 16시 07분 35초
접수번호
2616
발표코드
ANAL2.O-4
이곳을 클릭하시면 발표코드에 대한 설명을 보실 수 있습니다.
발표시간
금 09시 : 35분
발표형식
구두발표
발표분야
Analytical Chemistry -
Oral Presentation of Young Analytical Chemists II
저자 및
공동저자
GwangHoon Lee
, Boklae Cho
1,*
Charged Particle Beam Research Institute, ModuleSci Co., Ltd., Korea
1
Korea Research Institute of Standards and Science, Korea
Light microscopes can obtain color information but do not provide resolution below submicron. The electron microscope can provide much higher resolution information in nanometer scale, but it has the disadvantage that the image is grayscale. As a result of changing the source of the microscope from light to electrons, high resolution was achieved, but the most important visual information, the color, was lost. In order to solve these problems, recently a Correlative Light and Electron Microscope(CLEM) has been developed by integrating an light microscope and an electron microscope, and related researches have been actively conducted. Capability of acquiring color-based information as well as nanometer sacle surface information of a sample gives users a new possibility in their research. Previously, samples were observed by s light microscope, and then transferred to an electron microscope. However, in this case, the time and space efficiency is poor, and the sample can be damaged during the transfer of the sample. However, the microscope developed by ourself has the advantage of reducing the chance of sample damage and observation time because there is no need to move the sample by operating the light microscope and electron microscope simultaneously inside the vacuum. For the identification of defects such as quantum dots and LEDs, a resolution of less than a micrometer(μm) is required, but an light microscope can not show microscopic defects due to the resolution limit. Since the light and the electron beam provide complementary information, it is required to develop a fusion microscope that observes the sample with visible light and enlarges the suspected region using electrons. In this study, we introduce an iCLEM that can present images in real time by integrating light microscope and electron microscope into one system. The light path of the light microscope is positioned inside the optics of the electron microscope so that the coaxial alignment is achieved. This makes it possible to acquire images of fluorescent images and electron microscopes at high magnifications without moving the sample in the vacuum chamber. The iCLEM may provide researchers with diverse applications in inspection and analysis where a wider resolution spectrum is required in the future.
상단으로