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제123회 대한화학회 학술발표회, 총회 및 기기전시회 안내 Spatially offset based Raman scattering-based line-mapping as means to determine sample particle size

등록일
2019년 2월 9일 13시 24분 47초
접수번호
5113
발표코드
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발표시간
금 09시 : 36분
발표형식
구두발표
발표분야
Analytical Chemistry - Oral Presentation of Young Analytical Chemists II
저자 및
공동저자
Sang hoon Cho, Hoeil Chung1,*
Chemistry, Hanyang University, Korea
1Department of Chemistry, Hanyang University, Korea
Spatially offset based Raman scattering (SORS)-based line-mapping has been evaluated as a means for determining sample particle size. In SORS measurement, the position of Raman photon collection is away from that of laser excitation. As previous studied, the distribution of Raman photons became broader with the increase in particle size, as the mean free path of laser photons, the average photon travel distance between consecutive scattering locations, became longer under this situation. Therefore, when a SORS line mapping is performed along a packed powder sample, the peak intensities of sample in a series of the mapped spectra expect to decrease as offset distance becomes longer. Moreover, the slope in the change of intensity would be related with particle size, such as a greater slope for larger particle size. This possibility was the driving force for this research. For investigation, polyethylene (PE) powders with different particle sizes (300-200, 200-150, 150-100 and 100-75 micron) were prepared and SORS-line mapping was performed for each sample. Then, the slope of peak intensity was examined in relation with sample particle size. Various samples with different densities and refractive indices are under evaluation for deeper exploration.

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