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  • 09월 20일 16시 이후 : 초록수정 불가능, 일정확인 및 검색만 가능

제126회 대한화학회 학술발표회 및 총회 Discrimination of Degradation Mechanism for OLED by Noninvasive, Layer-selective Analysis

등록일
2020년 9월 17일 10시 22분 34초
접수번호
1109
발표코드
PHYS.O-5 이곳을 클릭하시면 발표코드에 대한 설명을 보실 수 있습니다.
발표시간
화 10시 : 00분
발표형식
구두발표
발표분야
Physical Chemistry - Oral Presentation for Young Physical Chemists
저자 및
공동저자
Jung Bae Son, Seong Keun Kim*
Division of Chemistry, Seoul National University, Korea

Despite the importance of elucidating the degradation mechanism of the organic light-emitting diodes (OLEDs) and the role of each layer played in degradation, little is known to date. To gain an insight into the cause of degradation and decouple the effects of different layers on degradation, we devised a method for layer-selective analysis of OLED devices. We fabricated OLED panels with 3 layers (each for electron transport, emission, and hole transport) whose emission wavelengths and lifetime are distinct from one another, and thus can be discriminated against each other. We found two types of degradation mechanism and different degradation features for each layer. These results raise the prospect of understanding the ultimate cause of degradation by noninvasively tracking the whole layers during actual operation. In addition, the method we developed here can be readily adopted in other studies as a powerful diagnostic tool for improving device characteristics.


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