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129th General Meeting of Korean Chemical Society & Exposition A new era of quantitative analysis for chemically heterogeneous nanomaterials: STXM & Ptychography

Submission Date :
2 / 27 / 2022 , 18 : 53 : 43
Abstract Number :
Presenting Type:
Presenting Area :
Material Chemistry - Synchrotron Radiation Based Development and Analysis of Advanced Materials
Authors :
Young-Sang Yu
Department of Physics, Chungbuk National University, Korea
Assigned Code :
MAT2-4 Assigend Code Guideline
Presenting Time :
FRI, 10 : 30

Visualization capable of nonequilibrium chemical states and their morphologies at proper spatial/spectral resolution is central to elucidating the complex phenomena in nanomaterials that underpin materials’ properties. These observations need to provide quantitative information at multiple scales, including the single-particle level, where incomplete reactions and failure at the required length and time scales are prone to occur. Scanning transmission X-ray microscopy (STXM) combined with high-brightness X-ray synchrotrons is an ideal tool to probe a wide variety of contrast mechanisms for studying material properties. However, it has been limited in spatial resolution to many times the X-ray wavelength by the nature of X-ray focusing optics. X-ray ptychography, on the other hand, has been developing as a kind of coherent X-ray scattering-based imaging scheme. The scattering from the sample as a function of X-ray source brightness and wavelength only limits achievable spatial resolution under an ideal instrumentation condition. This talk will present recent accomplishments to adapt STXM & ptychographic imaging at the Advanced Light source (ALS). The main objectives are to explore and develop a multimodal, multidimensional, and multi-length scale methodology to follow the chemical and microstructural evolution at the nanoscale. Our efforts for demonstration of multidimensional, multilength scale, and multimodal visualizations will allow spectro-microscopy with faster data acquisition rates in OASIS (Ochang Advanced Synchrotron for Industry and Science) to perform dynamic 3D measurements over larger field-of-view, with higher spatial resolution, under specific sample environments, such as varying temperature, applied voltage, or other-directed influences.