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| Type |
Poster Presentation |
| Area |
Physical Chemistry |
| Room No. |
Exhibition Hall 2+3 |
| Time |
10월 20일 (금요일) 13:00~14:30 |
| Code |
PHYS.P-106 |
| Subject |
Noninvasive, Layer-selective Analysis of OLED Degradation |
| Authors |
JUNGBAE SON, JOO YOUN KANG, Sohyeon Bae, Key Young Yang1, Jongseok Han2, Changhee Lee2, Seong Keun Kim*
Division of Chemistry, Seoul National University, Korea
1Department of Electrical and Computer Engineering, Seoul National University, Korea
2Seoul National University, Korea
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| Abstract |
Despite the importance of understanding the ultimate cause of the degradation of organic light-emitting diodes (OLEDs) and identifying the specific layer responsible for such degradation, much is not known to date. To examine individual layers of an OLED device for degradation and identify the culprit for OLED degradation, we devised a noninvasive, layer-selective analysis method. We designed an OLED panel whose 3 layers (for electron transport, emission, and hole transport) have distinct emission wavelengths and thus can be discriminated from one another. We measured the photoluminescence intensity and lifetime of each layer as the OLED panel was subject to electro-degradation. We were able to spectrally separate layers and found different degradation features of each layer. This method is highly suited for noninvasively analyzing the mechanism of electro-degradation and the change occurring in each layer as a result. |
| E-mail |
jbson91@hotmail.com |
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120th General Meeting of the KCS