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| Type |
Symposium |
| Area |
[Analytical Chemistry Division - JASIS (Japan) Joint Symposium] Elemental Analysis Using Plasma Spectroscopy and Mass Spectrometry |
| Room No. |
Room C308+C309 |
| Time |
FRI 14:50-: |
| Code |
ANAL-2 |
| Subject |
Purification of 4N Gallium by zone refining and trace by Glow discharge mass spectrometer analysis |
| Authors |
Jasik Yoon
Division of Advanced materials engineering, ChungNam National University, Korea |
| Abstract |
Recently, the market demand for high-purity metal is increased and purification method of the gallium high productivity is required. Gallium have low melting point (29.76 °C) and super cooling properties and that property was not applied to zone refining method of the ordinary. Therefore, we produced zone refining system for low melting metal by using Direct Cooling and Indirect heating. Purification of 4N gallium was carried out zone refining process. Depending on the refining process up to 5pass, the trace metal impurities such as B, Al, S, Cr, Fe, Ni and Si decrease 4N to 6N. We adopted GD90(MSI, UK) to the measurement of impurities in high purity Gallium metal for prevent gallium melt. GDMS, especially GD 90 is a powerful analytical method capable of analyzing solid samples without chemical decomposition step and analyzing a low-melting metal by adopting liquid nitrogen cooling and slow sputter method. |
| E-mail |
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120th General Meeting of the KCS