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|
| Type |
Poster Presentation |
| Area |
Material Chemistry |
| Room No. |
Event Hall |
| Time |
4월 20일 (금요일) 11:00~12:30 |
| Code |
MAT.P-561 |
| Subject |
Fractal dimension analysis in ferroelectric copolymer thin films using R-based image processing |
| Authors |
Seon Hyoung Kim, Jongin Hong1,*
Chung-Ang University, Korea
1Department of Chemistry, Chung-Ang University, Korea
|
| Abstract |
We studied the fractal analysis in ferroelectric copolymer films to understand the effect of polarization relaxation on domain wall roughness. Under humidity-controlled conditions that can affect the polarization dynamics, polarization relaxation of irregular domains results from the domain back reversal at the boundaries where the antiparallel polarization encounters, and therefore has a significant influence on the fractal dimension of the irregular domains as a function of time. The polarization switching was characterized by piezoresponse force microscopy (PFM). The thickness was determined by transmission electron microscopy (TEM), and the crystalline structure was characterized by X-ray diffraction and Fourier transform infrared spectroscopy (FT-IR). |
| E-mail |
kimsh9560@gmail.com |
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121st General Meeting of the KCS