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Type |
Award Lecture in Division |
Area |
Generation Networking Symposium in Analytical Chemistry |
Room No. |
Room 321 |
Time |
THU 17:30-: |
Code |
ANAL1-6 |
Subject |
Analytical Approaches to a Failure Analysis from chemicals to devices
in Displays
|
Authors |
Hyuk Nyun Kim Department of Analytical Technology, LG Display, Korea |
Abstract |
The Display industries in Korea have been played important roles in the production of various displays such as LCDs and OLEDs, as a core technology based business of Korea since 2000. More advanced developments and production of better performed products of various displays from mobile to large TV applications, have always been required appropriate analytical tools or methods which can help us to monitor higher quality manufacturing and to identify the root cause of problems.
To improve the quality of state of the art display products, we need to find out and verify the failure mechanism of defects such as dark spots, bright spots, an abnormal display such as mura and image sticking as well as the mechanism of degradation of life time of OLEDs.
We discuss the general analytical approaches to elucidate the root causes of display defects and decay of life time of displays using from chemical analytical instruments, GC-MS, LC-MS, SFC-MS to surface sensitive analytical instruments, XPS/ToF-SIMS/D-SIMS and structural analytical instruments, TEM/FIB/SEM with various sample pre-treatment tools for chemicals, components and devices.
|
E-mail |
hnkimlcd@lgdisplay.com |
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