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| Type |
Poster Presentation |
| Area |
Analytical Chemistry |
| Room No. |
Exhibition Hall 2 |
| Time |
4월 19일 (금요일) 11:00~12:30 |
| Code |
ANAL.P-267 |
| Subject |
Spatially offset based Raman scattering-based line-mapping as means to determine sample particle size |
| Authors |
Sang hoon Cho, Hoeil Chung1,*
Chemistry, Hanyang University, Korea
1Department of Chemistry, Hanyang University, Korea
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| Abstract |
Spatially offset based Raman scattering (SORS)-based line-mapping has been evaluated as a means for determining sample particle size. In SORS measurement, the position of Raman photon collection is away from that of laser excitation. As previous studied, the distribution of Raman photons became broader with the increase in particle size, as the mean free path of laser photons, the average photon travel distance between consecutive scattering locations, became longer under this situation. Therefore, when a SORS line mapping is performed along a packed powder sample, the peak intensities of sample in a series of the mapped spectra expect to decrease as offset distance becomes longer. Moreover, the slope in the change of intensity would be related with particle size, such as a greater slope for larger particle size. This possibility was the driving force for this research. For investigation, polyethylene (PE) powders with different particle sizes (300-200, 200-150, 150-100 and 100-75 micron) were prepared and SORS-line mapping was performed for each sample. Then, the slope of peak intensity was examined in relation with sample particle size. Various samples with different densities and refractive indices are under evaluation for deeper exploration. |
| E-mail |
pshraygood@naver.com |
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123rd General Meeting of the KCS