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  • 09월 20일 16시 이후 : 초록수정 불가능, 일정확인 및 검색만 가능

제126회 대한화학회 학술발표회 및 총회 Development of Ultra-low Frequency (<100 cm-1) Raman Spectroscopy and Studies of Absolute Raman Cross-sections of Sulfur Film

2020년 9월 17일 15시 16분 09초
PHYS.O-6 이곳을 클릭하시면 발표코드에 대한 설명을 보실 수 있습니다.
화 10시 : 15분
Physical Chemistry - Oral Presentation for Young Physical Chemists
저자 및
Mingyeong Shin, Juwon Kim, Yeonsu Jeong, Myeongkee Park1,*
Chemistry, Dong-A University, Korea
1Department of Chemistry, Dong-A University, Korea

Recently, the diverse scope of ultra-low frequency Raman studies has greatly grown because interlayer and skeletal vibrations are located at <100 cm-1 correlated to specific interactions of functional materials, such as graphene, WS2, and perovskites. However, quantitative analyses using absolute Raman cross-sections (σR) have less studied than qualitative analyses using normalized Raman spectra. σR is the effective area proportional to the possibility of Raman scattering by an incident excitation. This σR can be determined by Equation 1. F is the integrated area under the photon flux for Raman mode. Pp is the pump power incident upon the sample. N is the atomic concentration of sulfur and L is the effective thickness that contributes to scattering. hvp is the photon pump energy. ƞc is the optical collection efficiency of Raman spectrometer. We have developed a home-built ultra-low frequency Raman spectrometer and measured σR of sulfur at <200 cm-1. (Figure 1) In this talk, we will present our on- and off-resonant absolute σR values of sulfur. We expect these σR of sulfur can be the relative references for quantitative ultra-low frequency Raman studies of materials.