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  • 02월 22일 16시 이후 : 초록수정 불가능, 일정확인 및 검색만 가능

TOF-SIMS analysis of organic materials in the special field

등록일
2008년 2월 14일 00시 34분 41초
접수번호
1217
발표코드
30P233포 이곳을 클릭하시면 발표코드에 대한 설명을 보실 수 있습니다.
발표시간
목 <발표Ⅰ>
발표형식
포스터
발표분야
분석화학
저자 및
공동저자
이지혜, 김강진, 이연희1
고려대학교 화학과,
1한국과학기술연구원 특성분석센터,
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) technique is very useful when the quantity of the sample is few or little, and it is a very precious sample. In this work, in order to widen applied range of SIMS to archeology and forensic science field, we analyze the dyed fabrics and the red stamping inks. First, the fabrics dyed with natural dyes and synthetic dyes were investigated with TOF-SIMS. Specific fragment ions and molecular ions of dye chemicals were identified in TOF-SIMS and XPS data. Several ancient fabrics were also investigated to identify the natural dyes. Secondly, Korean, Chinese and Japanese red stamping inks were purchased in the markets and were measured inorganic, organic components and stamping ink / print ink sequence relation. Each red stamping ink showed the specific ion peaks from inorganic species such as Ca, Al, Cl, Zn, Ba and Pb, and from organic components at the mass range of m/z 150-400. The removal of several fibers from paper can be accomplished leaving little evidence of tampering and they were analyzed successfully by TOF-SIMS.

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